A3 to Present at Exporting Event
A3 will present at the upcoming Discover Global Markets: U.S. Manufacturers to Europe and Beyond in Cleveland, September 18-20, 2017. The event, held by the International Trade Administration’s U.S. Commercial Service, will bring together hundreds of small businesses from around the U.S. to help them boost their sales overseas.
Presenting at the event for A3 will be Bob Doyle, Director of Communications. He is moderating a panel titled “Advanced Manufacturing: Using Advanced Manufacturing to Win Globally.” Joining him on the panel includes Bart Weihl, Executive – Global Operations, Advanced Manufacturing Initiatives Group at GE and Tom O’Reilly, Vice President, Global Business Development, Rockwell Automation.
“Many of the key ingredients to the exporting ‘recipe’ will be at Cleveland’s Discover Global Markets Event,” said Susan Whitney, the U.S. Commercial Service Director in Cleveland. “Small businesses will have the chance to meet with procurement executives from global OEMs and gain on-the-ground market intelligence from U.S. government trade experts coming from all over the world.”
The conference features tracks for the aerospace, advanced manufacturing and automotive industries, as well as sessions for all exporters. Other confirmed speakers will come from General Electric, NASA, Pratt & Whitney, Bell Helicopter, McKinsey Global Institute, Siemens PLM Software, Rockwell Automation, the Goodyear Tire & Rubber Co., and Airbus Americas.
U.S. trade experts stationed in embassies and consulates representing over 16 European markets, including Canada and Mexico, will come to Cleveland to hold one-on-one meetings with attendees to provide strategies on entering new markets.
Recently released analysis from the International Trade Administration show the impact that small businesses have in growing U.S. exports:
Discover Global Markets: U.S. Manufacturers & Beyond will take place at the Westin Cleveland Hotel. Registration is $395 per person. Learn more and register at the event website.